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Spectrograph Measures Contamination Of Optical ElementsScanning-monochromator spectrograph designed to measure contamination on surfaces of optical elements as function of time. Repeatedly exposes samples to environment, then measures their transmittances or reflectances over range of wavelengths. Intended for use at vacuum-ultraviolet wavelengths to evaluate effects of outgassing, heating, and cooling on optical instruments. Principle of operation also applicable to spectral monitoring of time-dependent contamination at other wavelengths and in laboratory, industrial, or other settings.
Document ID
19890000122
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Flint, Bruce K.
(Acton Research Corp.)
Fancy, Robert D.
(Acton Research Corp.)
Jarratt, Robert V., Jr.
(Acton Research Corp.)
Date Acquired
August 14, 2013
Publication Date
March 1, 1989
Publication Information
Publication: NASA Tech Briefs
Volume: 13
Issue: 3
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
MFS-26076
Accession Number
89B10122
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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