Measuring Shapes Of Reflectors By Microwave Holography

Pair of reports discusses theoretical foundation and recent theoretical and practical developments in use of microwave holography to measure surfaces of microwave antennas. (Second report abbreviated version of first report.) Microwave holographic measurements provide acceptable accuracy and are more convenient and less time consuming than optical and mechanical measurements, especially where measurements repeated. Microwave holographyic metrology of lare reflectors, first reported in 1976, improved into accurate technique with potential industrial applications.