NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Interactions of light with rough dielectric surfaces - Spectral reflectance and polarimetric propertiesThe nature of the interactions of visible and NIR radiation with the surfaces of rock and mineral samples was investigated by measuring the reflectance and the polarization properties of scattered and reflected light for slab samples of obsidian and fine-grained basalt, prepared to controlled surface roughness. It is shown that the degree to which radiation can penetrate a surface and then scatter back out, an essential criterion for mineralogic determinations based on reflectance spectra, depends not only upon the composition of the material, but also on its physical condition such as sample grain size and surface roughness. Comparison of the experimentally measured reflectance and polarization from smooth and rough slab materials with the predicted models indicates that single Fresnel reflections are responsible for the largest part of the reflected intensity resulting from interactions with the surfaces of dielectric materials; multiple Fresnel reflections are much less important for such surfaces.
Document ID
19890023528
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Yon, S. A.
(Brown Univ. Providence, RI, United States)
Pieters, C. M.
(Brown University Providence, RI, United States)
Date Acquired
August 13, 2013
Publication Date
January 1, 1988
Subject Category
Lunar And Planetary Exploration
Meeting Information
Meeting: Lunar and Planetary Science Conference
Location: Houston, TX
Country: United States
Start Date: March 16, 1987
End Date: March 20, 1987
Accession Number
89A10899
Funding Number(s)
CONTRACT_GRANT: NAGW-748
CONTRACT_GRANT: NAGW-28
Distribution Limits
Public
Copyright
Other

Available Downloads

There are no available downloads for this record.
No Preview Available