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Transmission electron microscopy of compositesSince interphase-interfaces are often both the structurally weakest and chemically least stable regions of a composite material, they are critical determinants of such macrostructural characteristics as tensile strength and fracture toughness. Attention is presently given to the use of TEM for the study of interfaces between dissimilar materials; electron-diffraction, analytical, and high-resolution forms of TEM are employed, for the cases of both structural and semiconductor composites. The materials studied are SiC/Si, GaP/Si, and SiC fiber- and whisker-reinforced Si3N4.
Document ID
19890027189
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Pirouz, P.
(Case Western Reserve Univ. Cleveland, OH, United States)
Farmer, S. C.
(Case Western Reserve Univ. Cleveland, OH, United States)
Ernst, F.
(Case Western Reserve Univ. Cleveland, OH, United States)
Chung, J.
(Case Western Reserve University Cleveland, OH, United States)
Date Acquired
August 14, 2013
Publication Date
January 1, 1988
Subject Category
Composite Materials
Meeting Information
Meeting: International Conference on Composite Interfaces (ICCI-II)
Location: Cleveland, OH
Country: United States
Start Date: June 13, 1988
End Date: June 17, 1988
Accession Number
89A14560
Funding Number(s)
CONTRACT_GRANT: NCC3-73
CONTRACT_GRANT: N00014-86-K-0773
CONTRACT_GRANT: NAG3-758
Distribution Limits
Public
Copyright
Other

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