Transmission electron microscopy of compositesSince interphase-interfaces are often both the structurally weakest and chemically least stable regions of a composite material, they are critical determinants of such macrostructural characteristics as tensile strength and fracture toughness. Attention is presently given to the use of TEM for the study of interfaces between dissimilar materials; electron-diffraction, analytical, and high-resolution forms of TEM are employed, for the cases of both structural and semiconductor composites. The materials studied are SiC/Si, GaP/Si, and SiC fiber- and whisker-reinforced Si3N4.
Document ID
19890027189
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Pirouz, P. (Case Western Reserve Univ. Cleveland, OH, United States)
Farmer, S. C. (Case Western Reserve Univ. Cleveland, OH, United States)
Ernst, F. (Case Western Reserve Univ. Cleveland, OH, United States)
Chung, J. (Case Western Reserve University Cleveland, OH, United States)
Date Acquired
August 14, 2013
Publication Date
January 1, 1988
Subject Category
Composite Materials
Meeting Information
Meeting: International Conference on Composite Interfaces (ICCI-II)