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High temperature thermal conductivity measurements on lanthanum sulfides using the flash methodIn the past, high temperature specific heat and hence thermal conductivity measurements, using the flash method have not been very accurate. This is due to the difficulty of exactly determining the amount of heat deposited on the front face of a sample during each flash. This problem has now been solved by sputtering a thin layer of graphite on the standard reference and test samples. Data taken shows that the amount of heat deposited can now be determined to within about 2 percent resulting in more accurate thermal conductivity data. The results of measurements on several lanthanum sulfides with stoichiometries between LaS(1.35) and LaS(1.48) are reported and show a minimum in the lattice thermal conductivity at a composition of around LaS(1.41). This is believed to be due to the scattering of low-frequency phonons by large defects, i.e., second phase material (beta-phase) and pores.
Document ID
19890029129
Acquisition Source
Legacy CDMS
Document Type
Conference Proceedings
Authors
Vandersande, J. W.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Wood, C.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Zoltan, A.
(California Institute of Technology Jet Propulsion Laboratory, Pasadena, United States)
Whittenberger, D.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
August 14, 2013
Publication Date
January 1, 1988
Subject Category
Chemistry And Materials (General)
Accession Number
89A16500
Distribution Limits
Public
Copyright
Other

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