Characterization of electron-beam induced damage structures in natural fluorite, CaF2, by analytical electron microscopyThis paper describes the damage structure induced in natural CaF2 by the electron beam when using TEM. The observed 10-20 nm periodic features with coherent fringe patterns and the pronounced loss of fluorine found after the TEM exposure of 100-line-oriented and 111-oriented sections of CaF2 provides support for the mechanism of damage by decomposition of CaF2 into 2F and Ca, with the Ca precipitates maintaining a close topotaxial relationship with the parent CaF2.
Document ID
19890035514
Acquisition Source
Legacy CDMS
Document Type
Conference Proceedings
Authors
Blake, D. F. (NASA Ames Research Center Moffett Field, CA, United States)
Freund, Friedemann (NASA Ames Research Center Moffett Field, CA, United States)
Allard, L. F. (Oak Ridge National Laboratory TN, United States)
Echer, C. J. (California, University Berkeley, United States)