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Full temperature single event upset characterization of two microprocessor technologiesData for the 9450 I3L bipolar microprocessor and the 80C86 CMOS/epi (vintage 1985) microprocessor are presented, showing single-event soft errors for the full MIL-SPEC temperature range of -55 to 125 C. These data show for the first time that the soft-error cross sections continue to decrease with decreasing temperature at subzero temperatures. The temperature dependence of the two parts, however, is very different.
Document ID
19890038404
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
doi:10.1109/23.25508
Authors
Nichols, Donald K. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Coss, James R. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Smith, L. S. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Rax, Bernard (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Huebner, Mark (California Institute of Technology Jet Propulsion Laboratory, Pasadena, United States)
Date Acquired
August 14, 2013
Publication Date
December 1, 1988
Publication Information
Publication: IEEE Transactions on Nuclear Science
Volume: 35
ISSN: 0018-9499
Subject Category
Electronics And Electrical Engineering
Accession Number
89A25775
Distribution Limits
Public
Copyright
Other

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