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W-band six-port network analyzer for two-port characterization of millimeter wave transistorsA W-band (75-100 GHz) six-port junction network analyzer was constructed from commercially available descrete waveguide components and was used for the direct two-port S-parameter measurement of active three-terminal devices. A comparison between the six-port and a down-converter-type frequency extender for a conventional network analyzer revealed the superior performance of the six-port. The application of the six-port to characterize a 0.1-micron gate-length HEMT at W-band is described, and representative results are presented.
Document ID
19890043915
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Moeller, Karl J.
(NASA Langley Research Center Hampton, VA; California, University, Los Angeles, United States)
Schaffner, James H.
(NASA Langley Research Center Hampton, VA, United States)
Fetterman, Harold R.
(California, University Los Angeles, United States)
Date Acquired
August 14, 2013
Publication Date
March 1, 1989
Publication Information
Publication: Review of Scientific Instruments
Volume: 60
ISSN: 0034-6748
Subject Category
Electronics And Electrical Engineering
Accession Number
89A31286
Distribution Limits
Public
Copyright
Other

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