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Temperature control in wafer-level testing of large multi-segment electromigration test structuresThe paper describes two methods for maintaining a constant metallization temperature throughout a wafer-level isothermal electromigration test of large multisegment test structures where Joule-heating is high and chip to chuck thermal contact is poor. In the first method, an initial calibration of Joule heating versus metal temperature is carried out. During the isothermal electromigration test, the Joule heating is continuously monitored and the chuck temperature is adjusted based on the calibration results to maintain a constant metal temperature. In the second method, temperature sensors are fabricated on the chip and then the sensors are used to monitor the chip temperature directly. The chuck temperature is then adjusted as needed.
Document ID
19890044957
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Zamani, Nasser
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Lin, Yu-Sang
(California Institute of Technology Jet Propulsion Laboratory, Pasadena, United States)
Date Acquired
August 14, 2013
Publication Date
February 1, 1988
Subject Category
Electronics And Electrical Engineering
Accession Number
89A32328
Distribution Limits
Public
Copyright
Other

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