NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Temperature dependence of penetration depth in thin film niobiumA novel technique is presented which should allow precise determination of the temperature dependence of the inductance, and hence of the penetration depth, of superconducting niobium thin-film structures. Four niobium thin-film stripline inductors are arranged in a bridge configuration, and inductance differences are measured using a potentiometric technique with a SQUID (superconducting quantum interference device) as the null detector. Numerical simulations of the stripline inductances are presented which allow the performance of the measurement technique to be evaluated. The prediction of the two-fluid model for the penetration-depth temperature dependence is given for reduced temperatures of 0.3 to 0.9. The experimental apparatus and its resolution and accuracy are discussed.
Document ID
19890049767
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
More, N.
(Stanford Univ. CA, United States)
Muhlfelder, B.
(Stanford Univ. CA, United States)
Lockhart, J.
(Stanford University CA, United States)
Date Acquired
August 14, 2013
Publication Date
March 1, 1989
Publication Information
Publication: IEEE Transactions on Magnetics
Volume: 25
ISSN: 0018-9464
Subject Category
Electronics And Electrical Engineering
Accession Number
89A37138
Distribution Limits
Public
Copyright
Other

Available Downloads

There are no available downloads for this record.
No Preview Available