An experimental study of memory fault latency

The difficulty with the measurement of fault latency is due to the lack of observability of the fault occurrence and error generation instants in a production environment. The authors describe an experiment, using data from a VAX 11/780 under real workload, to study fault latency in the memory subsystem accurately. Fault latency distributions are generated for stuck-at-zero (s-a-0) and stuck-at-one (s-a-1) permanent fault models. The results show that the mean fault latency of an s-a-0 fault is nearly five times that of the s-a-1 fault. An analysis of variance is performed to quantify the relative influence of different workload measures on the evaluated latency.