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Scanning Tunneling Microscopy methods for spectroscopic imaging of subsurface interfacesA new method for spatially-resolved, spectroscopic investigation of subsurface interface structure has been developed. The method, Ballistic Electron Emission Microscopy (BEEM), is based on Scanning Tunneling Microscopy (STM) techniques. BEEM combines STM vacuum tunneling with unique ballistic electron spectroscopy capabilities. BEEM enables, for the first time, direct imaging of subsurface interface electronic properties with nanometer spatial resolution. STM topographic images of surface structure and BEEM images of subsurface properties are obtained simultaneously. BEEM capabilities are demonstrated by investigation of important metal-semiconductor interfaces.
Document ID
19890060926
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Bell, L. D.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Kaiser, W. J.
(California Institute of Technology Jet Propulsion Laboratory, Pasadena, United States)
Date Acquired
August 14, 2013
Publication Date
January 1, 1988
Publication Information
Publication: Scanning Microscopy
Volume: 2
Issue: 3, 19
Subject Category
Instrumentation And Photography
Accession Number
89A48297
Distribution Limits
Public
Copyright
Other

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