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X-ray morphologies of Abell clustersResults are presented for X-ray measurements made with the Einstein Observatory's IPC for a sample of 49 Abell clusters, which were used to determine quantitative measures of two morphological parameters of these clusters, the orientation and ellipticity. Consideration is given to the techniques used for estimating and removing background noise in the images and for determining the variation of these parameters with the flux level of a cluster. It was found that most clusters are clearly flattened; for 20 of these clusters, the orientation was unambiguously determined. A catalog of cluster properties is presented.
Document ID
19890062738
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Mcmillan, S. L. W.
(Drexel University Philadelphia, PA, United States)
Kowalski, M. P.
(U.S. Navy, E. O. Hulburt Center for Space Research, Washington DC, United States)
Ulmer, M. P.
(Northwestern University Evanston, IL, United States)
Date Acquired
August 14, 2013
Publication Date
August 1, 1989
Publication Information
Publication: Astrophysical Journal Supplement Series
Volume: 70
ISSN: 0067-0049
Subject Category
Astrophysics
Accession Number
89A50109
Funding Number(s)
CONTRACT_GRANT: NAG8-604
Distribution Limits
Public
Copyright
Other

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