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Exact Chord-Length Distribution For SEU CalculationsComputed rates of SEU's more accurate. Exact integral chord-length distribution derived for use in calculations of rates of single-event upsets (SEU's) (changes in logic states) caused by impingement of cosmic rays or other ionizing radiation on electronic logic circuits.
Document ID
19900000146
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Buehler, Martin G.
(Caltech)
Luke, Keung L.
(California State Univ.)
Date Acquired
August 14, 2013
Publication Date
April 1, 1990
Publication Information
Publication: NASA Tech Briefs
Volume: 14
Issue: 4
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
NPO-17657
Accession Number
90B10146
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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