NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Holographic ReticleHolographic reticle proposed for use in nondestructive evaluation of surface irregularities. Extends inspection capability to include measurements of depth. Surfaces inspected without contamination, damage, or costly disassembly. Provides valuable information difficult to obtain. For example, surface defects as corrosion and porosity, as well as propagation of cracks, measured accurately. Roughness, wear, and plating thickness also measured. Also used to determine quality of microcircuits.
Document ID
19900000495
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Henn, Edward A.
(Rockwell International Corp.)
Scribner, Marc M.
(Rockwell International Corp.)
Date Acquired
August 14, 2013
Publication Date
September 1, 1990
Publication Information
Publication: NASA Tech Briefs
Volume: 14
Issue: 9
ISSN: 0145-319X
Subject Category
Fabrication Technology
Report/Patent Number
MFS-29597
Accession Number
90B10495
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

Available Downloads

There are no available downloads for this record.
No Preview Available