A monochromator based on W/C multilayers of 40 A layer spacingThe design and preliminary performance data are presented for a monochromator based on two multilayer X-ray mirrors. The monochromator is based on mirrors with a d-spacing of 40 A and is designed to operate in the 5-75 A wavelength regime which can be varied by interchanging the mirrors with ones of different d-spacing. The multilayer mirrors are fabricated using sputter deposition and typically consist of 40 layer pairs of W and C. Except for W/Si, which shows 1-2 percent better reflectivities over the 7-40 A range but 4-10 percent poorer reflectivities for wavelengths longer than 40 A and shorter than 7 A, calculations performed using other combinations of materials generally show poorer reflectivities over the wavelength range of interest. Plans for a four-mirror version of the monochromator that will have increased resolution are also presented.
Document ID
19900023152
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Smith, A. (Wisconsin Univ. Madison, WI, United States)
Riedel, C. (Wisconsin Univ. Madison, WI, United States)
Edwards, B. (Wisconsin Univ. Madison, WI, United States)
Savage, D. (Wisconsin Univ. Madison, WI, United States)
Lai, B. (Wisconsin, University Madison, United States)
Date Acquired
August 14, 2013
Publication Date
January 1, 1988
Subject Category
Instrumentation And Photography
Meeting Information
Meeting: X-Ray Multilayers for Diffractometers, Monochromators, and Spectrometers