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Possible use of pattern recognition for the analysis of Mars rover X-ray fluorescence spectraOn the Mars rover sample-return mission, the rover vehicle will collect and select samples from different locations on the Martian surface to be brought back to earth for laboratory studies. It is anticipated that an in situ energy-dispersive X-ray fluorescence (XRF) spectrometer will be on board the rover. On such a mission, sample selection is of higher priority than in situ quantitative chemical anlaysis. With this in mind, a pattern recognition technique is proposed as a simple, direct, and speedy alternative to detailed chemical analysis of the XRF spectra. The validity and efficacy of the pattern recognition technique are demonstrated by the analyses of laboratory XRF spectra obtained from a series of geological samples, in the form both of standardized pressed pellets and as unprepared rocks. It is found that pattern recognition techniques applied to the raw XRF spectra can provide for the same discrimination among samples as a knowledge of their actual chemical composition.
Document ID
19900024571
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Yin, Lo I
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Trombka, Jacob I.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Seltzer, Stephen M.
(NIST, Center for Radiation Research, Gaithersburg MD, United States)
Johnson, Robert G.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Philpotts, John A.
(USGS Reston, VA, United States)
Date Acquired
August 14, 2013
Publication Date
October 10, 1989
Publication Information
Publication: Journal of Geophysical Research
Volume: 94
ISSN: 0148-0227
Subject Category
Lunar And Planetary Exploration
Accession Number
90A11626
Distribution Limits
Public
Copyright
Other

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