Dynamical diffraction imaging (topography) with X-ray synchrotron radiationBy contrast to electron microscopy, which yields information on the location of features in small regions of materials, X-ray diffraction imaging can portray minute deviations from perfect crystalline order over larger areas. Synchrotron radiation-based X-ray optics technology uses a highly parallel incident beam to eliminate ambiguities in the interpretation of image details; scattering phenomena previously unobserved are now readily detected. Synchrotron diffraction imaging renders high-resolution, real-time, in situ observations of materials under pertinent environmental conditions possible.
Document ID
19900027966
Acquisition Source
Legacy CDMS
Document Type
Conference Proceedings
Authors
Kuriyama, M. (National Inst. of Standards and Technology Gaithersburg, MD, United States)
Steiner, B. W. (National Inst. of Standards and Technology Gaithersburg, MD, United States)
Dobbyn, R. C. (NIST Gaithersburg, MD, United States)