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Measurement of the effects of particulate contamination on X-ray reflectivityBecause particles of sizes larger than a few tenths microns adversely affect high resolution X-ray telescopes by scattering and absorbing X-rays, the cleanliness required to maintain the about 1 percent overall calibration precision desired for the Advanced X-ray Astrophysics Facility (AXAF) is being investigated. At the grazing angles used for the AXAF mirrors, each particle shadows a surface area about 100 times its geometric area, necessitating glass occlusion specifications much more stringent than typically stipulated for visible-light particulate contamination. On test flats coated with gold, controlled levels of contamination have been deposited spanning the range from 5 x 10 to the -5th to 0.005 fractional area covered, and the absorption component of extinction has been measured over a range of grazing angles and X-ray energies to verify the predicted effects of particulate contamination.
Document ID
19900051974
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Slane, P.
(Harvard-Smithsonian Center for Astrophysics Cambridge, MA, United States)
Mclaughlin, E. R.
(Harvard-Smithsonian Center for Astrophysics Cambridge, MA, United States)
Schwartz, D. A.
(Harvard-Smithsonian Center for Astrophysics Cambridge, MA, United States)
Van Speybroeck, L. P.
(Harvard-Smithsonian Center for Astrophysics Cambridge, MA, United States)
Bilbro, J. W.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
August 14, 2013
Publication Date
January 1, 1989
Subject Category
Optics
Meeting Information
Meeting: Reflective Optics II
Location: Orlando, FL
Country: United States
Start Date: March 27, 1989
End Date: March 29, 1989
Accession Number
90A39029
Distribution Limits
Public
Copyright
Other

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