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X-ray/EUV optics for astronomy and microscopy; Proceedings of the Meeting, San Diego, CA, Aug. 7-11, 1989Topics included in these proceedings are on X-ray/EUV zone plates, filters, and windows; X-ray/EUV microscopes, telescopes, and monochromators; the design, characterization, and test of multilayer optics; the fabrication of X-ray/EUV multilayer optics; and the design, characterization, and test of grazing incidence X-ray optics. Other topics are on the fabrication of grazing incidence X-ray optics, X-ray/EUV space observatories and missions, the test and calibration of X-ray/EUV instruments, X-ray polarimetry, and X-ray/EUV spectroscopy and instruments. Papers are presented on 8-keV X-ray zone plates, a cylindrical X-ray multilayer monochromator, multilayer mirrors for 182 A, advanced flow polishing of exotic optical materials, and optical analysis of grazing incidence ring resonators for free-electron lasers. Attention is also given to X-ray mirrors for the European Synchrotron Radiation Facility, the XUV wide-field camera for Rosat, an optical test and alignment method for the XMM mirror module, Bragg crystal polarimeters, and a liftoff process for multilayer phase gratings.
Document ID
19900058951
Acquisition Source
Legacy CDMS
Document Type
Conference Proceedings
Authors
Hoover, Richard B.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
August 14, 2013
Publication Date
January 1, 1989
Subject Category
Optics
Report/Patent Number
SPIE-1160
Meeting Information
Meeting: X-ray/EUV Optics for Astronomy and Microscopy
Location: San Diego, CA
Country: United States
Start Date: August 7, 1989
End Date: August 11, 1989
Sponsors: New Mexico State Univ., JPL, SPIE
Accession Number
90A46006
Distribution Limits
Public
Copyright
Other

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