Dielectric properties measurement of substrate and support materials

In this paper a fast and straightforward waveguide measurement technique is described for the determination of the dielectric constant and loss tangent of many commercially available materials. These dielectric materials include Cuflon, Teflon, Arlon's polyimides, Lockheed's ceramic foams, and Rogers Duroid materials. The effective dielectric constant and loss tangent of Hexsel's honeycomb material is also measured by this method and is compared to the predicted data obtained using the volume averaging theory. The accuracy and other features of this measurement technique are also discussed.