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Rapid Dry Etching Of Photoresists Without Toxic GasesExperimental dry etching technique strips photoresists from semiconductor wafers without damaging semiconductor materials. Makes use of afterglow existing downstream from plasma generated by radio-frequency electric field. Constituents of afterglow react with sacrificial polymer to make reactive gases that quickly etch-away photoresist. Strips quickly at room temperature; not necessary to heat substrates. No hazardous or toxic chemicals used.
Document ID
19910000271
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Lerner, Narcinda R.
(NASA Ames Research Center, Moffett Field, CA.)
Wydeven, Theodore
(NASA Ames Research Center, Moffett Field, CA.)
Date Acquired
August 14, 2013
Publication Date
June 1, 1991
Publication Information
Publication: NASA Tech Briefs
Volume: 15
Issue: 6
ISSN: 0145-319X
Subject Category
Fabrication Technology
Report/Patent Number
ARC-11873
Accession Number
91B10271
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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