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Scanning X-Ray Or Extreme-Ultraviolet MonochromatorWavelength of peak transmission of proposed high-throughput, narrow-band-pass x-ray or extreme-ultraviolet monochromator continuously adjustable. Essential filtering and reflecting components designed according to principles described in "Compact X-Ray and Extreme-Ultraviolet Monochromator" (MFS-28499). However, angle of incidence varied to change wavelength of Bragg reflection.
Document ID
19910000376
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Hoover, Richard (NASA Marshall Space Flight Center, Huntsville, AL.)
Date Acquired
August 14, 2013
Publication Date
August 1, 1991
Publication Information
Publication: NASA Tech Briefs
Volume: 15
Issue: 8
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
MFS-28492
Accession Number
91B10376
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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