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Designing Accelerated Tests Of ElectromigrationMethod for design of accelerated tests of electromigration (as in microscopic conductors in integrated circuits) based partly on simplified mathematical model of electromigration and partly on error analysis. Objective to determine quickly operating life of tested components under normal operating conditions by extrapolation from lifetime measurements at operating stresses greater than normal. Involves compromise between reducing testing time by increasing stresses and reducing uncertainty in extrapolated lifetime by decreasing stresses.
Document ID
19910000377
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Buehler, Martin G.
(Caltech)
Date Acquired
August 14, 2013
Publication Date
August 1, 1991
Publication Information
Publication: NASA Tech Briefs
Volume: 15
Issue: 8
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
NPO-18012
Accession Number
91B10377
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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