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Ultra-High-Spectral-Resolution X-Ray/EUV MonochromatorUltra-high-spectral-resolution X-Ray/EUV monochromator depends on Bragg reflection from multilayer coats and diffraction by mutlilayer-coated grating to select narrow wavelength band from input beam. Its monochromatic output beam of accurately known wavelength very useful in testing and calibration of x-ray telescopes, x-ray microscopes, photographic films, and photodetectors; in research in biological and biomedical disciplines, x-ray crystallography, properties and processing of materials, and x-ray lasers; and in x-ray lithography.
Document ID
19910000439
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Hoover, Richard B.
(NASA Marshall Space Flight Center, Huntsville, AL.)
Date Acquired
August 14, 2013
Publication Date
September 1, 1991
Publication Information
Publication: NASA Tech Briefs
Volume: 15
Issue: 9
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
MFS-28500
Accession Number
91B10439
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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