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Electron attachment line shapes, cross sections, and rate constants at ultralow energies in CF3SO3H, (CF3SO2)2O, and CF3IElectron attachment cross sections are reported in the energy range 0-160 meV, and at resolutions of 6.0-6.5 meV (FWHM) for the molecules CF3SO3H (triflic acid), (CF3SO2)2O (triflic anhydride), and CF3I (methyl iodide). Use is made of the Kr photoionization method. Attachment line shapes are deconvoluted from the spectral slit (electron energy) function, and are converted to cross sections by normalization to thermal attachment rate constants at 300 K. Rate constants as a function of mean electron energy are calculated from the cross sections using a Maxwellian electron energy distribution function. Present data are compared with flowing-afterglow, Langmuir-probe results in triflic acid and anhydride, and with high-Rydberg ionization results in CF3I.
Document ID
19910043788
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Alajajian, S. H.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Man, K.-F.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Chutjian, A.
(JPL Pasadena, CA, United States)
Date Acquired
August 14, 2013
Publication Date
March 1, 1991
Publication Information
Publication: Journal of Chemical Physics
Volume: 94
ISSN: 0021-9606
Subject Category
Atomic And Molecular Physics
Accession Number
91A28411
Distribution Limits
Public
Copyright
Other

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