Thermal design and verification of an instrument cooling system for infrared detectors utilizing the Oxford Stirling cycle refrigeratorA detailed nodal computer model was developed to thermally represent the hardware, and sensitivity studies were performed to evaluate design parameters and orbital environmental effects of an instrument cooling system for IR detectors. Thermal-vacuum testing showed excellent performance of the system and a correspondence with math model predictions to within 3 K. Results show cold stage temperature sensitivity to cold patch backload, outer stage external surface emittance degradation, and cold stage emittance degradation, respectively. The increase in backload on the cold patch over the mission lifetime is anticipated to be less than 3.0 watts, which translates to less than a 3-degree increase in detector temperatures.
Document ID
19910052130
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Werrett, Stephen (Oxford, University United Kingdom)
Seivold, Alfred L. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
August 15, 2013
Publication Date
January 1, 1990
Subject Category
Spacecraft Design, Testing And Performance
Meeting Information
Meeting: Infrared Detectors and Focal Plane Arrays