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Low noise and conductively cooled microchannel platesMicrochannel plate (MCP) dynamic range has recently been enhanced for both very low and very high input flux conditions. Improvements in MCP manufacturing technology reported earlier have led to MCPs with substantially reduced radioisotope levels, giving dramatically lower internal background-counting rates. An update is given on the Galileo low noise MCP. Also, new results in increasing the MCP linear counting range for high input flux densities are presented. By bonding the active face of a very low resistance MCP (less than 1 megaohm) to a substrate providing a conductive path for heat transport, the bias current limit (hence, MCP output count rate limit) can be increased up to two orders of magnitude. Normal pulse-counting MCP operation was observed at bias currents of several mA when a curved-channel MCP (80:1) was bonded to a ceramic multianode substrate; the MCP temperature rise above ambient was less than 40 C.
Document ID
19910052148
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Feller, W. B.
(Galileo Electro-Optics Corp. Sturbridge, MA, United States)
Date Acquired
August 15, 2013
Publication Date
January 1, 1990
Subject Category
Instrumentation And Photography
Meeting Information
Meeting: Electron Image Tubes and Image Intensifiers
Location: Santa Clara, CA
Country: United States
Start Date: February 15, 1990
End Date: February 16, 1990
Accession Number
91A36771
Funding Number(s)
CONTRACT_GRANT: NAS1-18482
Distribution Limits
Public
Copyright
Other

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