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Sub-electron noise charge coupled devicesA charge coupled device designed for celestial spectroscopy has achieved readout noise as low as 0.6 electrons rms. A nondestructive output circuit was operated in a special manner to read a single pixel multiple times. Off-chip electronics averaged the multiple values, reducing the random noise by the square root of the number of readouts. Charge capacity was measured to be 500,000 electrons. The device format is 1600 pixels horizontal by 64 pixels vertical. Pixel size is 28 microns square. Two output circuits are located at opposite ends of the 1600 bit CCD register. The device was thinned and operated backside illuminated at -110 degrees C. Output circuit design, layout, and operation are described. Presented data includes the photon transfer curve, noise histograms, and bar-target images down to 3 electrons signal. The test electronics are described, and future improvements are discussed.
Document ID
19910052925
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Chandler, Charles E.
(Ford Aerospace Corp. Newport Beach, CA, United States)
Bredthauer, Richard A.
(Ford Aerospace Corp. Newport Beach, CA, United States)
Janesick, James R.
(JPL Pasadena, CA, United States)
Westphal, James A.
(California Institute of Technology Pasadena, United States)
Gunn, James E.
(Princeton University NJ, United States)
Date Acquired
August 15, 2013
Publication Date
January 1, 1990
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: Charge-Coupled Devices and Solid State Optical Sensors
Location: Santa Clara, CA
Country: United States
Start Date: February 12, 1990
End Date: February 14, 1990
Accession Number
91A37548
Funding Number(s)
CONTRACT_GRANT: NSF AST-85-03887
Distribution Limits
Public
Copyright
Other

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