dc modulation noise in thin film magnetic recording disk media

A study of dc modulation noise as a function of magnetic layer thickness has been conducted for plated longitudinal low-noise Co-alloy disk media with a range of 900 to 1100 Oe. The noise, produced by the application of a reverse longitudinal dc field to a uniformly magnetized disk, supplies data regarding the uniformity of the disk. A spectrum analyzer measures the noise by means of electronic detection, and noise spectra and autocorrelation functions calculated with a model are compared to the experimental results. The model correlates with experimental data to more than 0.99. The maximum distance between effective transitions diminishes from 2.8 microns to 1 micron when the thickness of the magnetic layer is increased from 25 nm to 60 nm. The maximum average transition amplitude is found to be independent of thickness, and is bounded by 0.001 of the saturation magnetization.