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High resolution, low energy avalanche photodiode X-ray detectorsSilicon avalanche photodiodes have been fabricated, and their performance as X-ray detectors has been measured. Photon sensitivity and energy resolution were measured as a function of size and operating parameters. Noise thresholds as low as 212 eV were obtained at room temperature, and backscatter X-ray fluorescence data were obtained for aluminum and other light elements. It is concluded that the results with the X-ray detector are extremely encouraging, and the performance is challenging the best available proportional counters. While not at the performance level of either cryogenic silicon or HgI2, these device operate at room temperature and can be reproduced in large numbers and with much larger areas than typically achieved with HgI2. In addition, they are rugged and appear to be indefinitely stable.
Document ID
19910057856
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Farrell, R.
(Radiation Monitoring Devices, Inc. Watertown, MA, United States)
Vanderpuye, K.
(Radiation Monitoring Devices, Inc. Watertown, MA, United States)
Entine, G.
(Radiation Monitoring Devices, Inc. Watertown, MA, United States)
Squillante, M. R.
(Radiation Monitoring Devices, Inc. Watertown, MA, United States)
Date Acquired
August 15, 2013
Publication Date
April 1, 1991
Publication Information
Publication: IEEE Transactions on Nuclear Science
Volume: 38
ISSN: 0018-9499
Subject Category
Instrumentation And Photography
Accession Number
91A42479
Funding Number(s)
CONTRACT_GRANT: NAS7-1018
Distribution Limits
Public
Copyright
Other

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