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The influence of interstitial Ga and interfacial Au2P3 on the electrical and metallurgical behavior of Au-contacted III-V semiconductorsThe effect of introducing a very small amount of Ga into Au-contacted InP on the behavior of that contact system was investigated. It was found that Ga affected both the metallurgical and the electrical behavior of the system. It is shown that Ga atoms in the interstices of the Au lattice prevent the solid-state reactions that normally take place between Au and InP during contact sintering and cause an order of magnitude reduction in the specific contact resistivity. It is also shown that the presence of Ga affects the reactions of GaP and GaAs with Au contacts.
Document ID
19910058071
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Weizer, Victor G.
(NASA Lewis Research Center Cleveland, OH, United States)
Fatemi, Navid S.
(NASA Lewis Research Center; Sverdrup Technology, Inc. Cleveland, OH, United States)
Date Acquired
August 15, 2013
Publication Date
June 15, 1991
Publication Information
Publication: Journal of Applied Physics
Volume: 69
ISSN: 0021-8979
Subject Category
Electronics And Electrical Engineering
Accession Number
91A42694
Funding Number(s)
CONTRACT_GRANT: NAS3-25266
Distribution Limits
Public
Copyright
Other

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