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Atomic force microscope studies of fullerene films - Highly stable C60 fcc (311) free surfacesAtomic force microscopy and X-ray diffractometry were used to study 1500 A-thick films of pure C60 grown by sublimation in ultrahigh vacuum onto a CaF2 (111) substrte. Topographs of the films did not reveal the expected close-packed structures, but they showed instead large regions that correspond to a face-centered cubic (311) surface and distortions of this surface. The open (311) structure may have a relatively low free energy because the low packing density contributes to a high entropy of the exposed surface.
Document ID
19910060551
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Snyder, Eric J.
(California Univ. Los Angeles, CA, United States)
Tong, William M.
(California Univ. Los Angeles, CA, United States)
Williams, R. S.
(California Univ. Los Angeles, CA, United States)
Anz, Samir J.
(California, University Los Angeles, United States)
Anderson, Mark S.
(JPL Pasadena, CA, United States)
Date Acquired
August 14, 2013
Publication Date
July 12, 1991
Publication Information
Publication: Science
Volume: 253
ISSN: 0036-8075
Subject Category
Solid-State Physics
Accession Number
91A45174
Distribution Limits
Public
Copyright
Other

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