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The JPL Molecular Contamination Investigation FacilityThe Molecular Contamination Investigation Facility (MCIF) is discussed in terms of its use for improving the far-UV performance of a camera and its broader applications. The MCIF incorporates two independent vacuum systems with sample isolation chambers and regulated heat exchangers as well as three quartz-crystal microbalances (QCMs) and a residual gas analyzer. One cryogenic QCM is heat sunk into an LN2 heat exchanger, while the others are thermoelectrically controlled and are heat sunk into a regulated heat exchanger. Outgas accumulation can be measured at three surface temperatures between -180 and 80 C simultaneously, and results are presented for the testing of 34 samples in a large-chambered system and 22 samples in a system with a smaller chamber. The MCIF results provide a database for fabrication processes, material selection, maximum bakeout temperatures, and the development of an ultraclean bakeout chamber.
Document ID
19910070372
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Taylor, Daniel M.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Soules, David
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Osborn, David
(JPL Pasadena, CA, United States)
Date Acquired
August 14, 2013
Publication Date
January 1, 1990
Subject Category
Ground Support Systems And Facilities (Space)
Meeting Information
Meeting: Optical System Contamination: Effects, Measurement, Control II
Location: San Diego, CA
Country: United States
Start Date: July 10, 1990
End Date: July 12, 1990
Accession Number
91A54995
Distribution Limits
Public
Copyright
Other

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