A high resolution echelle spectrometer for soft X-ray and EUV astronomy

A new design is presented for high resolution spectroscopy from 80 to 400 A. This design employs grazing incidence optics and variable line-spaced gratings to achieve high resolution. Unlike some previously proposed EUV echelles, this design employs straight groove planar gratings, which are a well-proven, easily manufactured design. The instrument delivers a peak resolution of 7500 and a peak effective area of 3 sq cm.