LDEF SP-HVDE (Space Plasma-High Voltage Drainage Experiment) post-flight results: Leakage current and discharge

TRW designed and fabricated two identical SP-HVDE trays which were flown in the NASA LDEF (Long Duration Exposure Facility) for 5.75 years in the LEO (low earth orbit) environment. One tray was placed near the leading edge and one near the trailing edge, and investigations were performed to compare the environmental interactions on the dielectric samples of the two trays. Each tray consisted of six assemblies with Kapton dielectric samples of varying thicknesses (i.e., 2 mils, 3 mil, and 5 mils) biased under +/- 300 V, +/- 500 V, and +/- 1000 V. The original objective was successfully achieved by measuring the first in-flight average leakage current through the samples. Less than 5 percent of the post-flight coulometers behaved anomalously. The data should be valuable to the design and evaluation of spacecraft with high voltage systems. M/D (micrometeoroid and debris) impacts over the dielectric samples were examined using a SEM (Scanning Electron Microscope) and an EDS (Energy Dispersive x-ray Spectrometer). These impact sites were sprayed by silver which were most likely caused either by the impact or a 'local ESD' (electrostatic discharge).