NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Robust, angstrom level circularity profilometryA noncontacting approach is presented which involves measuring the local circumferential curvature of the test piece by simultaneously measuring its circumferential slope at two slightly displaced locations. A pair of sensing beams is scanned along the circumference, and a profile of curvature is built, from which the circularity profile is deduced. The sensing of curvature makes the approach insensitive to all types of vibration and drift and runout errors in the relative rotation. The special qualities of the approach are summarized which make it well suited to measuring cylindrical optics and enable it to accommodate radii as small as twenty millimeters.
Document ID
19920034830
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Glenn, Paul
(Bauer Associates, Inc. Wellesley, MA, United States)
Date Acquired
August 15, 2013
Publication Date
January 1, 1990
Subject Category
Instrumentation And Photography
Meeting Information
Meeting: Advanced Optical Manufacturing and Testing
Location: San Diego, CA
Country: United States
Start Date: July 9, 1990
End Date: July 11, 1990
Accession Number
92A17454
Distribution Limits
Public
Copyright
Other

Available Downloads

There are no available downloads for this record.
No Preview Available