The photoelectric effect from CsI by polarized soft X-raysStudies of the polarization dependence of the photoelectric effect produced by soft X-rays from CsI indicate that the geometrical effects in these experiments can often mimic the polarization signature. This paper presents a detailed calculation of these geometrical effects that are produced when the X-ray beam is not precisely aligned on a rotatable plane photocathode. The experimentally observed geometrical effects were used to precisely determine the realignment of the incident beam of polarized X-rays on a rotatable photocathode. The results allow determinations of the true polarization dependence of the photoemission from CsI. It is shown that the photoelectric effect in CsI depends on the polarization state of the X-rays.
Document ID
19920042599
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Shaw, Ping S. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Church, Eric D. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Hanany, Shaul (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Liu, Yee (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Fleischman, Judith (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Kaaret, Philip (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Novick, Robert (Columbia University New York, United States)
Manzo, Giuseppe (CNR Istituto di Fisica Cosmica con Applicazioni all'Informatica, Palermo, Italy)
Date Acquired
August 15, 2013
Publication Date
January 1, 1991
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: X-ray/EUV Optics for Astronomy, Microscopy, Polarimetry and Projection Lithography