A hard X-ray polarimeter utilizing Compton scatteringThe paper describes a 50-cm-diam prototype of a novel Compton-scattering-type polarimeter for hard X-rays in the energy range 30-100 keV. The characteristics of the prototype polarimeter were investigated for various conditions. It was found that, with polarized X-rays from a simple polarizer, the detection efficiency and the modulation factor of the polarimeter with a 40-mm thick scatterer were 3.2 percent and 0.57 percent, respectively, at about 60 keV.
Document ID
19920042601
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Sakurai, H. (NASA Marshall Space Flight Center Huntsville, AL; Yamagata University, Japan)
Noma, M. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Niizeki, H. (Yamagata University Japan)
Date Acquired
August 15, 2013
Publication Date
January 1, 1991
Subject Category
Instrumentation And Photography
Meeting Information
Meeting: X-ray/EUV Optics for Astronomy, Microscopy, Polarimetry and Projection Lithography