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High resolution X-ray diffraction imaging of lead tin tellurideHigh resolution X-ray diffraction images of two directly comparable crystals of lead tin telluride, one Bridgman-grown on Space Shuttle STS 61A and the other terrestrially Bridgman-grown under similar conditions from identical material, present different subgrain structure. In the terrestrial, sample 1 the appearance of an elaborate array of subgrains is closely associated with the intrusion of regions that are out of diffraction in all of the various images. The formation of this elaborate subgrain structure is inhibited by growth in microgravity.
Document ID
19920042989
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Steiner, Bruce
(NASA Langley Research Center Hampton, VA, United States)
Dobbyn, Ronald C.
(NASA Langley Research Center Hampton, VA, United States)
Black, David
(NASA Langley Research Center Hampton, VA, United States)
Burdette, Harold
(NASA Langley Research Center Hampton, VA, United States)
Kuriyama, Masao
(NASA Langley Research Center Hampton, VA, United States)
Spal, Richard
(NIST Gaithersburg, MD, United States)
Simchick, Richard
(NASA Langley Research Center Hampton, VA, United States)
Fripp, Archibald
(NASA Langley Research Center Hampton, VA, United States)
Date Acquired
August 15, 2013
Publication Date
December 1, 1991
Publication Information
Publication: Journal of Crystal Growth
Volume: 114
Issue: 4, De
ISSN: 0022-0248
Subject Category
Materials Processing
Accession Number
92A25613
Distribution Limits
Public
Copyright
Other

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