Microstress contrast in scanning electron acoustic microscopy of ceramicsA mathematical model of image contrast in scanning electron acoustic microscopy (SEAM) due to the effect of residual stresses in materials is presented. It is found that in regions near the ends of the radial cracks induced by Vickers indentation the SEAM micrographs reveal a rather large variation of the acoustic output signal.
Document ID
19920046109
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Cantrell, John H. (NASA Langley Research Center Hampton, VA; Cambridge, University, United Kingdom)
Qian, Menglu (Cambridge, University England; Tongji University, Shanghai, People's Republic of China, United States)
Date Acquired
August 15, 2013
Publication Date
January 1, 1991
Subject Category
Quality Assurance And Reliability
Meeting Information
Meeting: Annual Review of Progress in Quantitative Nondestructive Evaluation