NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login
Back to Results
Microstress contrast in scanning electron acoustic microscopy of ceramicsA mathematical model of image contrast in scanning electron acoustic microscopy (SEAM) due to the effect of residual stresses in materials is presented. It is found that in regions near the ends of the radial cracks induced by Vickers indentation the SEAM micrographs reveal a rather large variation of the acoustic output signal.
Document ID
19920046109
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Cantrell, John H. (NASA Langley Research Center Hampton, VA; Cambridge, University, United Kingdom)
Qian, Menglu (Cambridge, University England; Tongji University, Shanghai, People's Republic of China, United States)
Date Acquired
August 15, 2013
Publication Date
January 1, 1991
Subject Category
Quality Assurance And Reliability
Meeting Information
Meeting: Annual Review of Progress in Quantitative Nondestructive Evaluation
Location: La Jolla, CA
Country: United States
Start Date: July 15, 1990
End Date: July 20, 1990
Accession Number
92A28733
Distribution Limits
Public
Copyright
Other

Available Downloads

There are no available downloads for this record.

Related Records

There are no records associated with this record.
No Preview Available