Effect of structure and morphology on thermal and electrical properties of polycarbonate film capacitorsResearch is reported to identify polycarbonate (PC) film characteristics and fabrication procedures which extend the reliable performance range of PC capacitors to 125 C without derating, and establish quality control techniques and transfer technology to US PC film manufacturers. The approach chosen to solve these problems was to develop techniques for fabricating biaxially oriented (BX) 2 microns or thinner PC film with a low dissipation factor up to 140 C; isotropic dimensional stability; high crystallinity; and high voltage breakdown strength. The PC film structure and morphology was then correlated to thermal and electrical capacitor behavior. Analytical techniques were developed to monitor film quality during capacitor fabrication, and as a result, excellent performance was demonstrated during initial capacitor testing.
Document ID
19920048365
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Yen, S. P. S. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)