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High resolution imaging with multilayer soft X-ray, EUV and FUV telescopes of modest aperture and costThe development of multilayer reflective coatings now permits soft X-ray, EUV and FUV radiation to be efficiently imaged by conventional normal incidence optical configurations. Telescopes with quite modest apertures can, in principle, achieve images with resolutions which would require apertures of 1.25 meters or more at visible wavelengths. The progress is reviewed which has been made in developing compact telescopes for ultra-high resolution imaging of the sun at soft X-ray, EUV and FUV wavelengths, including laboratory test results and astronomical images obtained with rocket-borne multilayer telescopes. The factors are discussed which limit the resolution which has been achieved so far, and the problems which must be addressed to attain, and surpass the 0.1 arc-second level. The application of these technologies to the development of solar telescopes for future space missions is also described.
Document ID
19920062553
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Walker, Arthur B. C., Jr.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Lindblom, Joakim F.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Timothy, J. G.
(Stanford University CA, United States)
Hoover, Richard B.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Barbee, Troy W., Jr.
(Lawrence Livermore National Laboratory Livermore, CA, United States)
Baker, Phillip C.
(Baker Consulting Walnut Creek, CA, United States)
Powell, Forbes R.
(Luxel, Inc. Friday Harbor, WA, United States)
Date Acquired
August 15, 2013
Publication Date
January 1, 1991
Subject Category
Astronomy
Meeting Information
Meeting: Space Astronomical Telescopes and Instruments
Location: Orlando, FL
Country: United States
Start Date: April 1, 1991
End Date: April 4, 1991
Sponsors: SPIE
Accession Number
92A45177
Distribution Limits
Public
Copyright
Other

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