Time-resolved far-field analysis of a high power single emitter laser diode

A system was developed which is capable of measuring the time-resolved far-field radiation patterns from a high-power semiconductor laser under intensity modulated conditions. Angular steering of the fundamental spatial mode was observed, with pointing variations as large as 0.5 deg, or 7.5 percent of the beamwidth, during the time of the optical pulse. The variations in pointing angle were directly related to gradients in the transverse index profile of the laser, which may oscillate based on lateral spatial hole burning of the gain and carrier density.