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More About Laser Scanner Tests For Single-Event UpsetsTwo reports describe preliminary theoretical and experimental studies based on method described in "Laser Scanner Tests For Single-Event Upsets" (NPO-18216). Laser-scan and heavy-ion data found correlated within factor of two. Method of testing for single-event upsets intended to overcome disadvantages of, complement, and/or substitute for more-expensive cyclotron-testing method, which does not provide spatial resolution.
Document ID
19930000018
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Kim, Quiesup (Caltech)
Edmonds, Larry D. (Caltech)
Zoutendyk, John A. (Caltech)
Schwartz, Harvey R. (Trend Western Technical Corp.)
Date Acquired
August 16, 2013
Publication Date
January 1, 1993
Publication Information
Publication: NASA Tech Briefs
Volume: 17
Issue: 1
ISSN: 0145-319X
Subject Category
Electronic Systems
Report/Patent Number
NPO-18494
Accession Number
93B10018
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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