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Magnetic Direct-Current-Measuring CircuitsTwo circuits measure large direct currents in main conductors by use of magnetic fields produced by currents in glassy metal toroidal ferromagnetic cores surrounding main conductors. In both circuits, direct currents to be measured deduced from transient voltages generated in multiturn windings by transitions between magnetic fields produced by measured currents and saturation magnetic fields of cores.
Document ID
19930000068
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Sullender, Craig C. (Rockwell International Corp.)
Johnson, Daniel D. (Rockwell International Corp.)
Walker, Dan E. (Rockwell International Corp.)
Gajewski, Marek (Rockwell International Corp.)
Krasnow, Dale S. (Rockwell International Corp.)
Date Acquired
August 16, 2013
Publication Date
February 1, 1993
Publication Information
Publication: NASA Tech Briefs
Volume: 17
Issue: 2
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
LEW-15070
Accession Number
93B10068
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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