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Indirect Calibration In Electron-Probe MicroanalysisTechnique for indirect calibration in electron-probe microanalysis reduces number of measurements needed without significantly degrading precision of measurement data. Advantageous when many analyses must be performed; for example, determining varying chemical composition at many positions across specimen of multicomponent alloy. Time spent acquiring data reduced considerably.
Document ID
19930000199
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Terepka, F. M.
(NASA Lewis Research Center, Cleveland, OH.)
Vijaykumar, M.
(Cleveland State Univ.)
Tewari, S. N.
(Cleveland State Univ.)
Date Acquired
August 16, 2013
Publication Date
April 1, 1992
Publication Information
Publication: NASA Tech Briefs
Volume: 17
Issue: 4
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
LEW-15107
Accession Number
93B10199
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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