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Multiwavelength Pyrometry To Correct For ReflectionsComputerized curve fitting yields more and better information on thermal radiation. Multiwavelength pyrometry involves measurement of spectrum of thermal radiation emitted by and reflected from specimen. Auxiliary source enables determination of spectral reflectance of specimen. Spectral reflectance and temperature of specimen obtained from spectral measurements by nonlinear least-squares curve-fitting routine.
Document ID
19930000264
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Ng, Daniel
(NASA Lewis Research Center, Cleveland, OH.)
Date Acquired
August 16, 2013
Publication Date
May 1, 1993
Publication Information
Publication: NASA Tech Briefs
Volume: 17
Issue: 5
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
LEW-15146
Accession Number
93B10264
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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