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Advanced Computed-Tomography Inspection SystemAdvanced Computed Tomography Inspection System (ACTIS) is computed-tomography x-ray apparatus revealing internal structures of objects in wide range of sizes and materials. Three x-ray sources and adjustable scan geometry gives system unprecedented versatility. Gantry contains translation and rotation mechanisms scanning x-ray beam through object inspected. Distance between source and detector towers varied to suit object. System used in such diverse applications as development of new materials, refinement of manufacturing processes, and inspection of components.
Document ID
19930000309
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Harris, Lowell D. (Bio-Imaging Research, Inc.)
Gupta, Nand K. (Bio-Imaging Research, Inc.)
Smith, Charles R. (Bio-Imaging Research, Inc.)
Bernardi, Richard T. (Bio-Imaging Research, Inc.)
Moore, John F. (Bio-Imaging Research, Inc.)
Hediger, Lisa (NASA Marshall Space Flight Center, Huntsville, AL.)
Date Acquired
August 16, 2013
Publication Date
June 1, 1993
Publication Information
Publication: NASA Tech Briefs
Volume: 17
Issue: 6
ISSN: 0145-319X
Subject Category
Electronic Systems
Report/Patent Number
MFS-27278
Accession Number
93B10309
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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